Optical characterisation of MOVPE-grown Ga1-xMnxAs semimagnetic semiconductor layers

Citation
T. Hartmann et al., Optical characterisation of MOVPE-grown Ga1-xMnxAs semimagnetic semiconductor layers, THIN SOL FI, 364(1-2), 2000, pp. 209-212
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
364
Issue
1-2
Year of publication
2000
Pages
209 - 212
Database
ISI
SICI code
0040-6090(20000327)364:1-2<209:OCOMGS>2.0.ZU;2-S
Abstract
For the first time, a successful growth of Ga1-xMnxAs layers on (100)GaAs s ubstrates by metal-organic vapour-phase epitaxy is reported. Optical and ma gneto-optical spectroscopy of the E-0, E-1 and E-1 + Delta(1) transitions i s possible due to the high structural quality of the samples. A strong exch ange interaction is found in the Ga1-xMnxAs layers between the magnetic mom ents of manganese and the excitonic states, which exhibits an effective fer romagnetic coupling. The Mn concentrations in the layers can be estimated b y two different and independent optical methods (i) from the Zeeman splitti ng of the E-0 excitons and (ii) from the red-shift of the E-1 transition du e to the p-doping with Mn. (C) 2000 Elsevier Science S.A. All rights reserv ed.