CHOICE OF OPTIMAL MULTIPARAMETRIC PROBABILITY-DISTRIBUTIONS OF INPUT VARIABLES FOR PROBABILISTIC TESTING OF DIGITAL CIRCUITS

Authors
BYKOV YV ZAKREVSKII LA YARMOLIK VN
Citation
Yv. Bykov et al., CHOICE OF OPTIMAL MULTIPARAMETRIC PROBABILITY-DISTRIBUTIONS OF INPUT VARIABLES FOR PROBABILISTIC TESTING OF DIGITAL CIRCUITS, Automation and remote control, 55(4), 1994, pp. 576-581
Citations number
11
Categorie Soggetti
Controlo Theory & Cybernetics","Computer Application, Chemistry & Engineering","Instument & Instrumentation","Robotics & Automatic Control
Journal title
Automation and remote control → ACNP
ISSN journal
00051179
Volume
55
Issue
4
Year of publication
1994
Part
2
Pages
576 - 581
Database
ISI
SICI code
0005-1179(1994)55:4<576:COOMPO>2.0.ZU;2-A
Abstract
A technique is proposed for optimization of the probabilities of bit g eneration in the test sequences for digital circuit testing.