Enhancing the lateral resolution in infrared microspectrometry by using synchrotron radiation: applications and perspectives

Citation
P. Dumas et al., Enhancing the lateral resolution in infrared microspectrometry by using synchrotron radiation: applications and perspectives, ANALUSIS, 28(1), 2000, pp. 68-74
Citations number
11
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ANALUSIS
ISSN journal
03654877 → ACNP
Volume
28
Issue
1
Year of publication
2000
Pages
68 - 74
Database
ISI
SICI code
0365-4877(200001/02)28:1<68:ETLRII>2.0.ZU;2-J
Abstract
The use of a much brighter source than the conventional blackbody allows an enhancement in lateral resolution in microanalysis using infrared spectros copy, which thus, becomes limited only by the diffraction criteria. Numerou s new applications have been performed in various research fields, which hi ghlight the usefulness of such a new analytical technique.