X-ray photoelectron spectroscopy and near-edge X-ray-absorption fine structure of C-60 polymer films

Citation
M. Ramm et al., X-ray photoelectron spectroscopy and near-edge X-ray-absorption fine structure of C-60 polymer films, APPL PHYS A, 70(4), 2000, pp. 387-390
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
ISSN journal
09478396 → ACNP
Volume
70
Issue
4
Year of publication
2000
Pages
387 - 390
Database
ISI
SICI code
0947-8396(200004)70:4<387:XPSANX>2.0.ZU;2-#
Abstract
We report core-level and valence-band X-ray photoelectron spectroscopy (XPS ) and carbon K near-edge X-ray-absorption fine structure spectroscopy (NEXA FS) results of plasma-pnlymerized C-60. In comparison with evaporated C-60 the C 1s peak is broader and asymmetric for the C-60 polymer and its shake- up satellites diminished. Furthermore, the features of the valence-band as well as the features of the pi* antibonding orbitals of the C-60 polymer ar e broader and reduced in intensity, Changes in the electronic structure are attributed to the polymerization of C-60, the post-plasma functionalizatio n of the surface by oxygen after exposure to atmosphere, and the occurrence of amorphous carbon.