Low-temperature scanning laser microscopy of individual filaments extracted from (Bi, Pb)(2)Sr2Ca2Cu3O10+x tapes

Authors
Sivakov, AG Lukashenko, AV Abraimov, D Muller, P Ustinov, AV Leghissa, M
Citation
Ag. Sivakov et al., Low-temperature scanning laser microscopy of individual filaments extracted from (Bi, Pb)(2)Sr2Ca2Cu3O10+x tapes, APPL PHYS L, 76(18), 2000, pp. 2597-2599
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
18
Year of publication
2000
Pages
2597 - 2599
Database
ISI
SICI code
0003-6951(20000501)76:18<2597:LSLMOI>2.0.ZU;2-V
Abstract
The method of low-temperature scanning laser microscopy is applied to visua lize the resistive state in individual superconducting filaments extracted from (Bi, Pb)(2)Sr2Ca2Cu3O10+x/Ag tapes. This technique is capable of imagi ng the distributions of the critical currents over a sample. Using the nonb olometric response, a spatial resolution of about 1 mu m is demonstrated fo r 10-mu m-thick filaments. Some of the resistively visualized grain boundar ies between crystallites show Josephson behavior. (C) 2000 American Institu te of Physics. [S0003-6951(00)02918-1].