Single grain boundary characterization of Nb-doped SrTiO3 bicrystals usingac four-point impedance spectroscopy

Citation
Jh. Hwang et al., Single grain boundary characterization of Nb-doped SrTiO3 bicrystals usingac four-point impedance spectroscopy, APPL PHYS L, 76(18), 2000, pp. 2621-2623
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
18
Year of publication
2000
Pages
2621 - 2623
Database
ISI
SICI code
0003-6951(20000501)76:18<2621:SGBCON>2.0.ZU;2-0
Abstract
AC four-point impedance spectroscopy has been applied to Nb-doped SrTiO3 bi crystals. Due to the simplified geometry and highly conductive bulk of the bicrystal, the reference impedance of the electrode was significantly reduc ed, validating the applicability of ac four-point impedance spectroscopy fo r electroceramics. DC current-voltage characteristics without any interfere nce due to electrodes confirmed these ac measurements. Using ac four-point impedance spectroscopy, grain boundary contributions are isolated and the c orresponding grain boundary thickness and resistivity are estimated. (C) 20 00 American Institute of Physics. [S0003-6951(00)00218-7].