Use of focused ion beam (FIB) techniques for production of diamond probe for nanotechnology-based single filament push-out tests

Authors
Trtik, P Reeves, CM Bartos, PJM
Citation
P. Trtik et al., Use of focused ion beam (FIB) techniques for production of diamond probe for nanotechnology-based single filament push-out tests, J MAT SCI L, 19(10), 2000, pp. 903-905
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE LETTERS
ISSN journal
02618028 → ACNP
Volume
19
Issue
10
Year of publication
2000
Pages
903 - 905
Database
ISI
SICI code
0261-8028(200005)19:10<903:UOFIB(>2.0.ZU;2-#