P. Wu et al., INFLUENCE OF THE THICKNESS OF TITANIUM AND COBALT LAYER ON THE INTERFACE AND MAGNETIZATION OF CO TI MULTILAYERS/, Physica status solidi. a, Applied research, 161(1), 1997, pp. 125-131
Two series of Co/Ti multilayers with different layer thicknesses are p
repared by dual facing target sputtering (DFTS) at a lower temperature
(approximate to 30 degrees C). The microstructure, composition modula
tion and the magnetic properties of the films are examined by various
methods. The samples are amorphous and have periodic layered structure
s and in-plane easy axes. In series A with constant Ti layer thickness
d(Ti) = 23 Angstrom, the saturation magnetization M-s of the film is
found to increase with increasing Co layer thickness d(Co), but to be
lower than that of a pure Co film because of the formation of a nonmag
netic layer d(0) at the interfaces. The thickness of d(0) is about 5.5
Angstrom, which differed significantly from the value of d(0) (approx
imate to 11.3 Angstrom) in other Co/Ti studies. The perpendicular magn
etization has an increasing tendency when d(Co) decreased. In series B
with d(Co) fixed at 18 Angstrom, the M-s, is found to decrease with d
(Ti) and approaches a constant value when d(Ti) is thick enough. This
is interpreted as due to the changes at the interface of the multilaye
rs.