INFLUENCE OF THE THICKNESS OF TITANIUM AND COBALT LAYER ON THE INTERFACE AND MAGNETIZATION OF CO TI MULTILAYERS/

Citation
P. Wu et al., INFLUENCE OF THE THICKNESS OF TITANIUM AND COBALT LAYER ON THE INTERFACE AND MAGNETIZATION OF CO TI MULTILAYERS/, Physica status solidi. a, Applied research, 161(1), 1997, pp. 125-131
Citations number
9
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
00318965
Volume
161
Issue
1
Year of publication
1997
Pages
125 - 131
Database
ISI
SICI code
0031-8965(1997)161:1<125:IOTTOT>2.0.ZU;2-C
Abstract
Two series of Co/Ti multilayers with different layer thicknesses are p repared by dual facing target sputtering (DFTS) at a lower temperature (approximate to 30 degrees C). The microstructure, composition modula tion and the magnetic properties of the films are examined by various methods. The samples are amorphous and have periodic layered structure s and in-plane easy axes. In series A with constant Ti layer thickness d(Ti) = 23 Angstrom, the saturation magnetization M-s of the film is found to increase with increasing Co layer thickness d(Co), but to be lower than that of a pure Co film because of the formation of a nonmag netic layer d(0) at the interfaces. The thickness of d(0) is about 5.5 Angstrom, which differed significantly from the value of d(0) (approx imate to 11.3 Angstrom) in other Co/Ti studies. The perpendicular magn etization has an increasing tendency when d(Co) decreased. In series B with d(Co) fixed at 18 Angstrom, the M-s, is found to decrease with d (Ti) and approaches a constant value when d(Ti) is thick enough. This is interpreted as due to the changes at the interface of the multilaye rs.