The genetic algorithm: refinement of X-ray reflectivity data from multilayers and thin films

Authors
Ulyanenkov, A Omote, K Harada, J
Citation
A. Ulyanenkov et al., The genetic algorithm: refinement of X-ray reflectivity data from multilayers and thin films, PHYSICA B, 283(1-3), 2000, pp. 237-241
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
283
Issue
1-3
Year of publication
2000
Pages
237 - 241
Database
ISI
SICI code
0921-4526(200006)283:1-3<237:TGAROX>2.0.ZU;2-V
Abstract
A genetic algorithm (GA) technique has been implemented for determination o f structural parameters of thin solid film and superlattice from the X-ray reflectivity and diffuse scattering data. The fundamental concepts underlyi ng genetic algorithms are described along with examples of classical nanost ructures illustrating successful application of GA. The method is demonstra ted to be robust and flexible in comparison with conventional optimization techniques. (C) 2000 Elsevier Science B.V. All rights reserved.