The ID01 beamline at the ESRF: the diffuse scattering technique applied tosurface and interface studies

Citation
Mj. Capitan et al., The ID01 beamline at the ESRF: the diffuse scattering technique applied tosurface and interface studies, PHYSICA B, 283(1-3), 2000, pp. 256-261
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
283
Issue
1-3
Year of publication
2000
Pages
256 - 261
Database
ISI
SICI code
0921-4526(200006)283:1-3<256:TIBATE>2.0.ZU;2-B
Abstract
One of the most remarkable characteristic of the ID01 beamline is tie: abse nce of windows in the beam path up to the diffraction detection stage. This feature combined with the presence of a wiggler and an undulator as insert ion devices allows diffraction experiments with a large energy range (from 2.1 keV up to 35 keV). This means that a large number of absorption edges o f different elements can be reached which enable one to profit from the ano malous behaviour of their scattering factors. A 4 + 2-circle diffractometer is mounted inside a vessel that can be put un der vacuum in order to decrease the background noise signal. The experiment al set-up combines several kinds of detectors that allows one to combine SA XS and WAXS experiments. All these characteristics make the ID01 beamline v ery suitable for the study of the morphology of the surface and the interfa ce of a large range of materials. (C) 2000 Elsevier Science B.V. All rights reserved.