Dissociative adsorption of Si2H6 on the Si(001) surface

Citation
M. Cakmak et Gp. Srivastava, Dissociative adsorption of Si2H6 on the Si(001) surface, PHYS REV B, 61(15), 2000, pp. 10216-10222
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
10980121 → ACNP
Volume
61
Issue
15
Year of publication
2000
Pages
10216 - 10222
Database
ISI
SICI code
1098-0121(20000415)61:15<10216:DAOSOT>2.0.ZU;2-6
Abstract
We present results of nb initio calculations, based on pseudopotentials and the density functional theory, for the dissociative adsorption of Si2H6 on the Si(001) surface. Various models are considered, containing H and the r adicals SiH3 and SiH2. Models based on the SiH2 radical were considered wit h three adsorption sites: (i) an on-dimer position, (ii) an intrarow positi on between two neighboring Si dimers in the same dimer row, and (iii) an in ter-row position between adjacent Si dimer rows. The intrarow and bridge ge ometries are considered with and without the saturation of the Si dangling bonds with hydrogen. For the 2 x 1 surface reconstruction, the on-dimer geo metry is energetically more favorable than the inter-row geometry. For the 2 x 2 reconstruction, without hydrogen passivation of the Si dangling bonds , the on-dimer and intrarow geometries leave the system fully passivated. W ith hydrogen passivation of the Si dangling bonds, the on-dimer geometry is more favorable than the intrarow geometry.