Angular dependence and interfacial roughness in exchange-biased ferromagnetic/antiferromagnetic bilayers

Citation
Jv. Kim et al., Angular dependence and interfacial roughness in exchange-biased ferromagnetic/antiferromagnetic bilayers, PHYS REV B, 61(13), 2000, pp. 8888-8894
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
10980121 → ACNP
Volume
61
Issue
13
Year of publication
2000
Pages
8888 - 8894
Database
ISI
SICI code
1098-0121(20000401)61:13<8888:ADAIRI>2.0.ZU;2-D
Abstract
A theoretical study of the angular dependence of exchange bias in coupled f erromagnetic/antiferromagnetic bilayers is presented. The variation of the bias field with applied field angle is shown to be strongly affected by the canting of the interfacial spins, particularly with the presence of defect s. Discontinuities in the angular dependence of the bias field are found to depend on the sense of rotation of the ferromagnetic layer upon reversal.