The ferroelectric properties of the bismuth titanate niobate Bi7Ti4NbO21 th
in film have been studied. The Bi7Ti4NbO21 thin film was successfully fabri
cated on platinized Si substrates by chemical solution deposition method. T
he crystallization of bismuth titanate niobate thin film was observed using
an X-ray diffraction analysis (XRD). The hysteresis loop was observed a st
andardized ferroelectric test system. The thin him exhibits ferroelectric h
ysteresis with remnant polarization P-r = 5.65 mu C/cm(2) and coercive fiel
d E-c = 127 kV/cm. (C) 2000 Elsevier Science S.A. All rights reserved.