Surface Brillouin spectroscopy makes it possible to measure surface elastic
wave propagation parameters at frequencies up to 20 GHz or more. This enab
les us to measure the elastic properties of surface layers only a small fra
ction of a micrometre thick. The wavelength and incident angle of the light
determine the wavenumber of surface elastic waves (SAW) that scatter the l
ight inelastically, and their frequency can be found by measuring the chang
e in wavelength of the scattered light. By analysing the elastic wave modes
present in the surface, the elastic properties can be deduced. We have use
d this technique to measure the elastic properties of layered nanocomposite
materials, which are widely used in the packaging industry. 12 mu m polyme
r films (PET) were coated with glass oxide layers of thickness as little as
25 nm, to give transparent nanocomposite structures with excellent gas bar
rier properties. In order to understand and model the behaviour of these fi
lms under deformation, it is necessary to determine the elastic properties
of the different layers. Evaluation of the elastic properties presents seve
ral challenges. First, the oxide layers are much thinner than the wavelengt
hs of the surface phonons in surface Brillouin spectroscopy (and hence the
depth probed), which usually lie in the range 250-500 nm. The anisotropic e
lastic properties of the PET substrate must therefore be measured accuratel
y, and this can be done using bulk Brillouin spectroscopy. Second, a thin l
ayer of metal (usually 10-20 nm) must be deposited on the glass surface so
that the surface phonons scatter the light effectively. The elastic propert
ies of the glass layer can then be deduced from surface Brillouin spectrosc
opy measurements, by simulating the surface wave modes of the metal/glass/p
olymer composite, and adjusting the parameters to give the best fit. In thi
s way it is possible to observe how the properties of the glass vary as a f
unction of thickness, and in turn to understand how to improve systematical
ly the properties under deformation. (C) 2000 Elsevier Science B.V. All rig
hts reserved.