Measurement of the linear electro-optic coefficients of sol-gel derived strontium barium niobate thin films using a two-beam polarization interferometer

Citation
J. Koo et al., Measurement of the linear electro-optic coefficients of sol-gel derived strontium barium niobate thin films using a two-beam polarization interferometer, APPL PHYS L, 76(19), 2000, pp. 2671-2673
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
19
Year of publication
2000
Pages
2671 - 2673
Database
ISI
SICI code
0003-6951(20000508)76:19<2671:MOTLEC>2.0.ZU;2-F
Abstract
A two-beam polarization interferometer in a reflection configuration is use d to measure the electro-optic coefficients of highly oriented strontium ba rium niobate thin films prepared by a sol-gel method. The technique enables the determination of the electro-optic coefficients of films using a stron g Fabry-Perot effect with automatic adjustment and maintenance of the opera tion point of the interferometer. The linear electro-optic coefficients inc rease with increasing Sr content in the films. (C) 2000 American Institute of Physics. [S0003-6951(00)01018-4].