Dependence of radiative lifetimes of porous silicon on excitation wavelength and intensity

Citation
Pj. Moyer et al., Dependence of radiative lifetimes of porous silicon on excitation wavelength and intensity, APPL PHYS L, 76(19), 2000, pp. 2683-2685
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
19
Year of publication
2000
Pages
2683 - 2685
Database
ISI
SICI code
0003-6951(20000508)76:19<2683:DORLOP>2.0.ZU;2-9
Abstract
Excited state radiative lifetime measurements are made on porous silicon as a function of excitation wavelength and excitation intensity. The results indicate that a simple quantum confinement model for the light absorption a nd emission mechanism is not suitable. We support our results by suggesting that a cascading energy transfer process among surface molecule-like state s is most likely active and we provide a general indication of the density of energy transfer states. (C) 2000 American Institute of Physics. [S0003-6 951(00)00319-3].