Two Fourier transform infrared (FT-IR) spectrometers with microspectroscopi
c capabilities-one equipped with a focal plane array (FPA) mercury-cadmium-
telluride (MCT) detector (imaging) and the other a single-element MCT detec
tor (mapping)-are compared, Two samples, a one-dimensional diffusion system
and a two-dimensional phase-separated system, were studied with both analy
tical tools. Diffusion regions and concentration gradients were determined
in the diffusion sample. Phase-specific chemical composition data were obta
ined in the phase-separated sample. The utility of each instrument for spec
ific cases and their respective limitations are illustrated. It is shown th
at the FPA system has the ability to sample a large sample area with high s
patial resolution in a short time without adverse diffraction effects. Beca
use of this very rapid sampling many dynamic processes can he studied which
are otherwise poorly monitored by the point-by-point mapping technique. Th
e spatial resolution achievable, the quality of data obtained [signal-to-no
ise ratio (SNR)], and temporal resolution between mapped areas are intimate
ly connected in the mapping system. However, the imaging systems have a fix
ed spatial resolution (dependent on the optics and detector) and the SNR co
nsiderations determine temporal resolution. However. it was also shown that
by aperturing to a localized region, the single-element detector system is
able to arrive at phase concentration information more rapidly, with less
cumbersome processing and with higher SNRs than is possible with the curren
t FPA technology. The chemical information obtained from both instruments i
s, within a small experimental error, identical. This work demonstrates wha
t can be accomplished with each analytical FT-IR instrument, and serves as
a comparative study to demonstrate the value of each analytical tool in spe
cific situations.