Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy

Citation
Cl. Pang et al., Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy, APPL SURF S, 157(4), 2000, pp. 233-238
Citations number
29
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
157
Issue
4
Year of publication
2000
Pages
233 - 238
Database
ISI
SICI code
0169-4332(200004)157:4<233:IRTSWN>2.0.ZU;2-N
Abstract
We have used non-contact atomic force microscopy (NC-AFM) to study TiO2(110 ), identifying a row with twice the thickness of a TiO2(110)1 X 2 row. This can be explained by a [1 (1) over bar 0] extension of the added row model of TiO2(110)1 X 2. In the [001] direction, this reconstruction narrows into a 1 X 2 row giving strong evidence that the two structures are very closel y related. For the TiO2(100) surface, we present NC-AFM data which supports the intermediate 1 X 3-beta model previously proposed on the basis of an S TM experiment. (C) 2000 Elsevier Science B.V. All rights reserved.