Kelvin probe force microscopy using near-field optical tips

Authors
Shikler, R Rosenwaks, Y
Citation
R. Shikler et Y. Rosenwaks, Kelvin probe force microscopy using near-field optical tips, APPL SURF S, 157(4), 2000, pp. 256-262
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
157
Issue
4
Year of publication
2000
Pages
256 - 262
Database
ISI
SICI code
0169-4332(200004)157:4<256:KPFMUN>2.0.ZU;2-F
Abstract
We report on the use of near-field optical force sensors for Kelvin probe f orce microscopy (KPFM) and surface potential measurements. It is shown that a very good potential sensitivity of less than 5 mV can be obtained using such tips. In addition, it is found that the contact potential difference m easured using these tips is independent of the scanning height, as long as it is below 40 nm, and of the applied AC amplitude as long as it is in the range of 1-3 V. (C) 2000 Elsevier Science B.V. All rights reserved.