Carbon nanotubes as tips in non-contact SFM

Authors
Barwich, V Bammerlin, M Baratoff, A Bennewitz, R Guggisberg, M Loppacher, C Pfeiffer, O Meyer, E Guntherodt, HJ Salvetat, JP Bonard, JM Forro, L
Citation
V. Barwich et al., Carbon nanotubes as tips in non-contact SFM, APPL SURF S, 157(4), 2000, pp. 269-273
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
157
Issue
4
Year of publication
2000
Pages
269 - 273
Database
ISI
SICI code
0169-4332(200004)157:4<269:CNATIN>2.0.ZU;2-J
Abstract
The demand for sharp and stable tips suggests the use of carbon nanotubes a s probing tips in scanning force microscopy. Here, we report a comparison o f the long-range forces of conventional tips and nanotube tips, topographic al images of various surfaces, such as Cu(lll), Si(111)7 X 7 and NaCl(100), as well as images of a bundle of multiwalled nanotubes, which was deposite d by severe tip crashing. It is found that the long-range forces of carbon nanotube probing tips are reduced and that they are more resistant to wear than conventional silicon tips (C) 2000 Elsevier Science B.V. All rights re served.