Piezoelectric quartz tuning forks have been employed as the force sensor in
a dynamic mode scanning force microscope operating at temperatures down to
1.7 K at He-gas pressures of typically 5 mbar. An electrochemically etched
tungsten tip glued to one of the tuning fork prongs acts as the local forc
e sensor. Its oscillation amplitude can be tuned between a few angstroms an
d tens of nanometers. Quality factors of up to 120 000 allow a very accurat
e measurement of small frequency shifts. Three calibration procedures are c
ompared which allow the determination of the proportionality constant betwe
en frequency shift and local force gradient based on the harmonic oscillato
r model and on electrostatic forces. The calibrated sensor is then used for
a study of the interaction between the tip and a highly oriented pyrolytic
graphite (HOPG) substrate. Force gradient and dissipated power can be reco
rded simultaneously. It is found that during approaching the tip to the sam
ple considerable power starts to be dissipated although the force gradient
is still negative, i.e., the tip is still in the attractive regime. This ob
servation concurs with experiments with true atomic resolution, which seem
to require the same tip-sample separation. (C) 2000 Elsevier Science B.V. A
ll rights reserved.