Normal and lateral force investigation using magnetically activated force sensors

Authors
Jarvis, SP Yamada, H Kobayashi, K Toda, A Tokumoto, H
Citation
Sp. Jarvis et al., Normal and lateral force investigation using magnetically activated force sensors, APPL SURF S, 157(4), 2000, pp. 314-319
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
157
Issue
4
Year of publication
2000
Pages
314 - 319
Database
ISI
SICI code
0169-4332(200004)157:4<314:NALFIU>2.0.ZU;2-2
Abstract
A new design of cantilever has been fabricated in order to easily apply the resonance dynamic measurement technique to lateral interactions between an atomic force microscope tip and sample. Simultaneous images have been obta ined in ultrahigh vacuum (UHV) for normal and lateral interactions by activ ating the cantilever independently at its normal and lateral resonant frequ ency. The distance dependence of the normal and lateral tip-sample interact ions have also been investigated. (C) 2000 Elsevier Science B.V. All rights reserved.