Using higher flexural modes in non-contact force microscopy

Authors
Pfeiffer, O Loppacher, C Wattinger, C Bammerlin, M Gysin, U Guggisberg, M Rast, S Bennewitz, R Meyer, E Guntherodt, HJ
Citation
O. Pfeiffer et al., Using higher flexural modes in non-contact force microscopy, APPL SURF S, 157(4), 2000, pp. 337-342
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
157
Issue
4
Year of publication
2000
Pages
337 - 342
Database
ISI
SICI code
0169-4332(200004)157:4<337:UHFMIN>2.0.ZU;2-8
Abstract
The oscillation characteristics of higher flexural modes of a rectangular m icrofabricated silicon cantilever have been studied in ultra-high vacuum (U HV) for a free cantilever and for a typical situation in non-contact force microscopy. The results are discussed with respect to the use of such modes in dynamic force microscopy (DFM) and local dissipation measurements. (C) 2000 Elsevier Science B.V. All rights reserved.