Polarization-dependent X-ray absorption spectroscopy of La2CuO4Fx thin films using synchrotron radiation

Citation
Jm. Chen et al., Polarization-dependent X-ray absorption spectroscopy of La2CuO4Fx thin films using synchrotron radiation, CHIN J PHYS, 38(2), 2000, pp. 231-236
Citations number
21
Categorie Soggetti
Physics
Journal title
CHINESE JOURNAL OF PHYSICS
ISSN journal
05779073 → ACNP
Volume
38
Issue
2
Year of publication
2000
Part
2
Pages
231 - 236
Database
ISI
SICI code
0577-9073(200004)38:2<231:PXASOL>2.0.ZU;2-S
Abstract
High-resolution polarization-dependent O K-edge x-ray absorption spectra fo r c-axis oriented La2CuO4Fx thin films were investigated. In the O 1s absor ption edge of La2CuO4Fx, the prepeak at 528.7 eV is assigned to transitions into O 2p(xy) hole states located in the CuO2 planes. Fluoride ions presen t in La2CuO4Fx induce hole states in the CuO2 planes near the Fermi level, which in turn play an important role in enhancing superconductivity for thi s compound, as compared to parent La2CuO4. In La2CuO4Fx, fluoride ions are regarded as an electronic dopant to induce superconductivity.