OTA-C based BIST structure for analog circuits

In this letter, a novel built-in self-test (BIST) structure based on operat ional transconductance amplifiers and grounded capacitors (OTA-Cs) for the fault diagnosis of analog circuits is proposed. The proposed analog BIST st ructure, namely ABIST, can be used to increase the number of test points, s ampling and controlling of all test points with voltage data, and making le ss time for test signal observable. Experimental measurements have been mad e to verify that the proposed ABIST structure is effective.