Silicon dioxide is transparent in wavelength down to vacuum UV, and high qu
ality film is obtained by thermal oxidation of Si substrate. Both of higher
-refractive-index guiding core and lower-index optical buffer layers consis
t of SiO2 films thermally-grown at different temperatures on Si substrate.
Silicon-on-insulator wafer, of which buried oxide layer of 3 mu m thickness
had been treated at >1100 degrees C to be optical buffer layer, was held i
n steam flow at 800 degrees C for oxidizing top Si layer to form SiO2 guidi
ng core layer of 1.2 mu m thickness. Guiding characteristics were measured
and showed good agreement with theoretical prediction.