Accurate estimation of aberrations of microoptics components through intensity measurements: Numerical simulations for best positioning and noise analysis

In this work we analyse the accuracy in the estimation of aberrations of mi crooptics components through intensity measurements by means of the transpo rt of intensity equation (TIE) retrieval scheme. Through results of numeric al simulations, the position of the measurement planes of transverse irradi ance as well as the separation between them is optimised in order to minimi se peak to valley values of the difference between the input wavefront and the retrieved one. Random gaussian noise with zero mean is included in the calculations.