Authors
Citation
E. Vlieg, ROD: A program for surface X-ray crystallography, J APPL CRYS, 33, 2000, pp. 401-405
Citations number
18
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN journal
00218898
→ ACNP
Volume
33
Year of publication
2000
Part
2
Pages
401 - 405
Database
ISI
SICI code
0021-8898(200004)33:<401:RAPFSX>2.0.ZU;2-8
Abstract
A brief description is given of the C-program ROD with which surface struct
ures can be refined on the basis of X-ray data. All main features one encou
nters on surfaces, like roughness, relaxations, reconstructions and multipl
e domains, are taken into account. The program has proven to be a useful to
ol over the past ten years. (C) 2000 International Union of Crystallography
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