Recently, ferromagnetic tunnel junctions attracted much interest because th
ey exhibit large magnetoresistance effects up to Delta R/R=40% at room temp
erature. In this paper, an alternative approach will be presented, i.e., ex
posing the aluminum film to ultraviolet light during oxidation. The underly
ing mechanism can be explained in the framework of the Cabrera-Mott theory
of oxidation. With UV assisted oxidation, magnetoresistance ratios of up to
22.5% at room temperature have been obtained in Ni80Fe20-Al(ox)-Co junctio
ns. The resistivities were in the 1 k Omega mu m(2) range for junctions of
25-400 mu m(2). Barrier heights obtained by fitting to different theories w
ill be discussed. (C) 2000 American Institute of Physics. [S0021-8979(00)55
308-0].