Flash temperature induced magnetic degradation in high density magnetic recording

Citation
Zm. Yuan et al., Flash temperature induced magnetic degradation in high density magnetic recording, J APPL PHYS, 87(9), 2000, pp. 6158-6160
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
9
Year of publication
2000
Part
3
Pages
6158 - 6160
Database
ISI
SICI code
0021-8979(20000501)87:9<6158:FTIMDI>2.0.ZU;2-V
Abstract
Slider disk impact, especially the impact with particles in between, genera tes flash temperatures at the contact area and creates thermal stress in th e magnetic layer of disk media. By modeling the effective magnetic fields o f the thermal stress and the thermal agitation, the flash temperature induc ed magnetic degradation is studied via micro-magnetic simulation. It is not iced that the recorded bit pattern can be fully erased near the area of the maximum thermal stress if the flash temperature approaches 673 K (grain si ze: 12 nm). The bit patterns with higher bit density corresponds to higher likelihood of data erasure if other conditions are the same. (C) 2000 Ameri can Institute of Physics. [S0021- 8979(00)84408-4].