A metal layered structure consisting of Cr/Cu buffer layer and two Co layer
s with different thickness, separated by a Cu spacer, was deposited on Si w
afers using magnetron sputtering. The influence of the individual layer's t
hickness on the magneto transport and magnetic hysteresis was studied. Opti
mization of the magnetoresistance performance was supported by the current
in-plane giant magnetoresistance (GMR) modeling based on the solution to th
e Boltzmann transport equation. The best structures demonstrated very sharp
magnetization reversal of the lower Co layer at about 100 Oe accompanied b
y resistivity change with a rate of 0.9%/Oe. Maximum GMR effect measured at
5 K was 9.6%. Samples with capping layers exhibited substantially smaller
switching fields of the upper Co layer than the uncapped samples with a min
ute amount of CoO. (C) 2000 American Institute of Physics. [S0021-8979(00)6
2608-7].