Measurements of exchange anisotropy in NiFe/NiO films with different techniques

Citation
Jr. Fermin et al., Measurements of exchange anisotropy in NiFe/NiO films with different techniques, J APPL PHYS, 87(9), 2000, pp. 6421-6423
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
9
Year of publication
2000
Part
3
Pages
6421 - 6423
Database
ISI
SICI code
0021-8979(20000501)87:9<6421:MOEAIN>2.0.ZU;2-Z
Abstract
One of the puzzles of the recent investigations on the exchange anisotropy in ferromagnetic (FM)/antiferromagnetic (AF) bilayers is the fact that diff erent techniques yield different values for the exchange field (H-E) betwee n the layers. We report an investigation on sputtered NiFe/NiO carried out with three different techniques, namely, magneto-optical Kerr effect magnet ometry (MOKE), Brillouin light scattering (BLS), and ferromagnetic resonanc e (FMR). In an attempt to reconcile the measurements obtained with the vari ous techniques, we interpret the data with a model that includes the format ion of a planar domain wall in the AF layer, giving rise to a torque on the FM moment represented by an effective domain wall field (H-W). We find out that while the same pair of values of H-E and H-W provide equally good fit s to the reversible FMR and BLS measurements, different pairs are necessary to fit the irreversible magnetometry data. (C) 2000 American Institute of Physics. [S0021-8979(00)85808-9].