Ballistic electron magnetic microscopy studies of magnetization reversal in Co/Cu/Co trilayer films

Citation
Wh. Rippard et Ra. Buhrman, Ballistic electron magnetic microscopy studies of magnetization reversal in Co/Cu/Co trilayer films, J APPL PHYS, 87(9), 2000, pp. 6490-6492
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
9
Year of publication
2000
Part
3
Pages
6490 - 6492
Database
ISI
SICI code
0021-8979(20000501)87:9<6490:BEMMSO>2.0.ZU;2-#
Abstract
We have used ballistic electron magnetic microscopy to image, with nanomete r resolution, the magnetization behavior of Co/Cu/Co trilayer films in the presence of a magnetic field. Films prepared both by thermal evaporation an d by magnetron sputtering have been studied. In each case we have observed both large, similar to 500 nm, domain structures, and much smaller, apparen tly randomly dispersed, regions of magnetic misalignment between the Co lay ers that persist to fields > 100 Oe. We find the details of the ballistic e lectron transport through the films to be different on small length scales, similar to 50 nm, for the two types of growth methods. (C) 2000 American I nstitute of Physics. [S0021-8979(00)80508-3].