S. Bae et al., Dependence of exchange coupling on the surface roughness and structure in alpha-Fe2O3/NiFe and NiFe/alpha-Fe2O3 bilayers, J APPL PHYS, 87(9), 2000, pp. 6650-6652
The exchange coupling characteristics for both Si/alpha-Fe2O3/NiFe and Si/N
iFe/alpha-Fe2O3 bilayers have been investigated. These two bilayers showed
completely different exchange coupling characteristics. The Si/alpha-Fe2O3
(50 nm)/NiFe(5 nm) bilayer had H-ex=62.5 Oe, H-c=137.5 Oe, while the Si/NiF
e(5 nm)/alpha-Fe2O3(50 nm) bilayer had H-ex=4.5 Oe, H-c=9.5 Oe. The larger
exchange bias field of alpha-Fe2O3/NiFe bilayer was mainly attributed to go
od crystallinity of alpha-Fe2O3 and the smooth interface between NiFe and a
lpha-Fe2O3. The interfacial exchange energy, J(ex) was also calculated for
these two bilayers. The case of the rougher surface of bilayer (Si/NiFe/alp
ha-Fe2O3) exhibited smaller interfacial exchange energy. In order to verify
the effect of alpha-Fe2O3 crystal structure on the exchange bias coupling
characteristics, Ti (hcp), Zr (hcp), Ta (bcc), and Cu (fcc) were used as bu
ffer layers for the Si/buffer layer/alpha-Fe2O3/NiFe structures. Ti and Zr
buffer layers showed good exchange coupling performance, which was strongly
related to good crystal matching with alpha-Fe2O3, but there was no exchan
ge coupling improvement in the case of Ta and Cu buffer layers. (C) 2000 Am
erican Institute of Physics. [S0021-8979(00)93808-8].