Domain wall trapping in controlled submicron ferromagnetic elements

Citation
A. Hirohata et al., Domain wall trapping in controlled submicron ferromagnetic elements, J APPL PHYS, 87(9), 2000, pp. 4727-4729
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
9
Year of publication
2000
Part
2
Pages
4727 - 4729
Database
ISI
SICI code
0021-8979(20000501)87:9<4727:DWTICS>2.0.ZU;2-6
Abstract
The domain configuration in permalloy wires (30 nm thick, 10 mu m wide, and 205 mu m long) with a wide size range of a narrow central bridge (5 mu m l ong and w mu m wide; 0.5 less than or equal to w less than or equal to 10 m u m) were investigated in both their demagnetized and remanent states using magnetic force microscopy and the results were confirmed by micromagnetic calculations. At the bridge region, domain walls were found to be shifted b y a small external field. Scanning magneto-optical Kerr effect revealed tha t the coercivity in these structures are the same as that in a straight wir e, suggesting that domain wall movement is the dominant process in the magn etization reversal of these structures. (C) 2000 American Institute of Phys ics. [S0021-8979(00)35408-1].