Measurement of field-dependent surface impedance tensor in amorphous wireswith circumferential anisotropy

Citation
Dp. Makhnovskiy et al., Measurement of field-dependent surface impedance tensor in amorphous wireswith circumferential anisotropy, J APPL PHYS, 87(9), 2000, pp. 4804-4806
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
9
Year of publication
2000
Part
2
Pages
4804 - 4806
Database
ISI
SICI code
0021-8979(20000501)87:9<4804:MOFSIT>2.0.ZU;2-4
Abstract
The surface impedance tensor sigma is found for 120 mu m diameter Co-based amorphous wires as a function of a dc axial magnetic field H-ex. Contrary t o the usual practice of giant magneto-impedance experiments, the voltage re sponse is measured not only across the wire but also in the external coil ( secondary coil), and the wire is subjected to an ac current flowing through it or the coil (primary coil), which allows all the components of the impe dance tensor sigma(zz), sigma(Phi Phi) and sigma(z Phi)=sigma(Phi z) to be determined. Under certain conditions, they all are very sensitive to H-ex ( especially sigma(Phi Phi): 100-250%/Oe) but exhibit a different field behav ior: the diagonal terms sigma(zz) and sigma(Phi Phi) are symmetrical with r espect to H-ex whereas the off-diagonal terms sigma(z Phi)=sigma(Phi z) are antisymmetrical, and at high frequencies, sigma(zz) has a minimum at H-ex= 0 where sigma(Phi Phi) has a maximum. The effect of a moderate dc bias curr ent I-b is demonstrated to be favored for sigma(z Phi) and sigma(Phi z), wh ich are nearly zero for I-b=0. These new magneto-impedance characteristics may further expand the application opportunities for the GMI effect. <(C)> 2000 American Institute of Physics.