Measurement dependence of the exchange bias

Citation
Hw. Xi et al., Measurement dependence of the exchange bias, J APPL PHYS, 87(9), 2000, pp. 4960-4962
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
9
Year of publication
2000
Part
2
Pages
4960 - 4962
Database
ISI
SICI code
0021-8979(20000501)87:9<4960:MDOTEB>2.0.ZU;2-V
Abstract
Recently, in addition to the conventional hysteresis loop measurement, seve ral different measurement techniques, such as ac susceptibility, ferromagne tic resonance (FMR), and Brillouin light scattering, have been used to stud y the unidirectional exchange coupling induced in a ferromagnetic film in p roximity to an antiferromagnet. In this article, we theoretically investiga te how interface exchange coupling manifests itself in different measuremen ts. The magnetic degrees of freedom of the antiferromagnet are incorporated in this analysis. Anisotropies from hysteresis loop measurements, ac susce ptibility measurements, and FMR measurements are obtained. These results sh ow that the measured exchange anisotropies differ with measurement techniqu es. (C) 2000 American Institute of Physics. [S0021-8979(00)36508-2].