Single nanoparticle measurement techniques

Authors
Wernsdorfer, W Mailly, D Benoit, A
Citation
W. Wernsdorfer et al., Single nanoparticle measurement techniques, J APPL PHYS, 87(9), 2000, pp. 5094-5096
Citations number
32
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
9
Year of publication
2000
Part
2
Pages
5094 - 5096
Database
ISI
SICI code
0021-8979(20000501)87:9<5094:SNMT>2.0.ZU;2-0
Abstract
Various single particle measuring techniques are briefly reviewed and the b asic concepts of a new microsuperconducting quantum interference device tec hnique are discussed. It allows measurements of the magnetization reversal of single nanometer-sized particles at low temperature. The influence of th e measuring technique on the system of interest is discussed. (C) 2000 Amer ican Institute of Physics. [S0021-8979(00)36608-7].