Investigation of advanced position error signal patterns in patterned media

A potential approach to extending current thin film media to 100 Gbits/in(2 ) recording density is physical patterning of the media, perhaps via an etc hing technique. An advantage of patterning is the capability of creating ad vanced position error signal (PES) patterns that are difficult or impossibl e to generate with writing by a recording head. This study uses spin stand tester to investigate various PES patterns generated by a focused ion beam etching technique on conventional thin film disks. For all practical purpos es, the patterned PES eliminates transition noise, track edge noise, and er ase band, therefore, demonstrates a much better PES signal than conventiona lly written servo patterns. (C) 2000 American Institute of Physics. [S0021- 8979(00)37408-4].