Biquadratic interlayer exchange coupling in epitaxial Fe/Si/Fe

Authors
Strijkers, GJ Kohlhepp, JT Swagten, HJM de Jonge, WJM
Citation
Gj. Strijkers et al., Biquadratic interlayer exchange coupling in epitaxial Fe/Si/Fe, J APPL PHYS, 87(9), 2000, pp. 5452-5454
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
9
Year of publication
2000
Part
2
Pages
5452 - 5454
Database
ISI
SICI code
0021-8979(20000501)87:9<5452:BIECIE>2.0.ZU;2-4
Abstract
We have studied the biquadratic exchange coupling in epitaxially grown Fe/S i/Fe. The temperature and thickness dependence of the biquadratic coupling strength were determined unambiguously by fitting the easy- and hard-axis m agneto-optical Kerr effect loops. The origin of the biquadratic coupling ca n be fully understood in terms of Slonczewski's loose spins mechanism. (C) 2000 American Institute of Physics. [S0021-8979(00)31208-7].