Magnetic and magneto-transport properties of gamma Fe2O3-grain-embedded Fe3
O4 thin films are investigated. The magnetoresistance (MR) abruptly changes
in the intermediate oxidation state between Fe3O4 and gamma Fe2O3. The mag
netic relaxation coefficient also becomes a minimum around this oxidation s
tate. The slow dynamics of the magnetic relaxation are associated with the
disturbance of the domain wall displacement due to the embedded gamma Fe2O3
grains with Fe2+ impurities. A possible mechanism for the change in the MR
is also proposed. (C) 2000 American Institute of Physics. [S0021-8979(00)3
3708-2].