Ferromagnetic properties and structures of the Mn-implanted GaAs semiconductor

Citation
Cj. Chen et al., Ferromagnetic properties and structures of the Mn-implanted GaAs semiconductor, J APPL PHYS, 87(9), 2000, pp. 5636-5638
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
9
Year of publication
2000
Part
2
Pages
5636 - 5638
Database
ISI
SICI code
0021-8979(20000501)87:9<5636:FPASOT>2.0.ZU;2-W
Abstract
Submicron ferromagnets have been successfully incorporated into semi-insula ting (001) GaAs crystals by Mn+ ion implantation and subsequent rapid annea ling. Magnetization measurements reveal room-temperature ferromagnetism. Th e structural and compositional properties of crystallites have been analyze d by transmission electron microscopy, energy dispersion x-ray spectrum, an d electron microdiffraction. The results show that crystallites of MnGa and MnAs with a small amount of Ga are formed. Atomic force microscopy and mag netic force microscopy images indicate that the single-domain magnetic stat e is dominant in submicron ferromagnets under our annealing conditions (750 degrees C-900 degrees C). (C) 2000 American Institute of Physics. [S0021-8 979(00)38208-1].