Correlation of surface roughness with the recording characteristics of thin metal-particle tape

Citation
A. Roesler et Jg. Zhu, Correlation of surface roughness with the recording characteristics of thin metal-particle tape, J APPL PHYS, 87(9), 2000, pp. 5663-5665
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
9
Year of publication
2000
Part
2
Pages
5663 - 5665
Database
ISI
SICI code
0021-8979(20000501)87:9<5663:COSRWT>2.0.ZU;2-9
Abstract
The presence of surface roughness in tape media results in a head-to-medium spacing that fluctuates throughout the recording process, which can have a large impact on the recording performance of the tape. To provide an under standing of the fluctuations introduced by the roughness, a self-consistent recording model combined with a micromagnetic MR readback module was used to study the recording (write) process on thin-layer metal-particle media w ith spatially correlated surface roughness. Correlation was made between th e surface roughness and the recording characteristics through a spatial ana lysis of the recordings. Media with both long and short roughness correlati on were investigated. Discussions on recording schemes that offer better im munity to the fluctuations introduced by the surface roughness are provided , and in particular the impact on write equalization is evaluated. (C) 2000 American Institute of Physics. [S0021-8979(00)39108-3].