The effect of interface on the electrical properties of (Ba, Sr)TiO3 adopting the perovskite electrodes

Citation
Bs. Kim et al., The effect of interface on the electrical properties of (Ba, Sr)TiO3 adopting the perovskite electrodes, J APPL PHYS, 87(9), 2000, pp. 4425-4429
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
9
Year of publication
2000
Part
1
Pages
4425 - 4429
Database
ISI
SICI code
0021-8979(20000501)87:9<4425:TEOIOT>2.0.ZU;2-2
Abstract
Perovskite type conducting materials (Ca, Sr)RuO3 and (Ba, Sr)RuO3 were pre pared by rf magnetron sputtering as bottom electrodes for (Ba, Sr)TiO3 thin film capacitors. The crystallinity, interface property, and electrical pro perties of the (Ba, Sr)TiO3 capacitor applying the perovskite oxide electro des were investigated. The interface between the dielectric and the electro de were analyzed by high-resolution electron microscopy and Auger electron spectroscopy. The interface had a marked effect on the electrical propertie s of the (Ba, Sr)TiO3 thin films. Dielectric constant for the (Ba, Sr)TiO3 had considerable dependence on the thickness of interfacial layer. The leak age current density of the capacitor was sensitive not only to the structur al match but also to the chemical match between (Ba, Sr)TiO3 and the electr ode. (C) 2000 American Institute of Physics. [S0021- 8979(00)01806-5].