The sulfur passivation of an n-GaN surface was investigated by employing an
aqueous (NH4)(2)S solution and (NH4)(2)S+t-C4H9OH solution. Photoluminesce
nce and Auger electron spectroscopy revealed that treatment with (NH4)(2)St-C4H9OH results in a more effective passivation of the n-GaN surface than
that with (NH4)(2)S due to a higher chemical reactivity of sulfur species i
n the former solution. The (NH4)(2)S+t-C4H9OH-treated sample shows a strong
er photoluminescence intensity by a factor of 2.5 with respect to an untrea
ted sample. In addition, improved Ohmic characteristics of the sample are e
vident from current-voltage measurements. This result can be attributed to
the effective removal of an insulating layer on the n-GaN surface. (C) 2000
American Institute of Physics. [S0021-8979(00)01109-9].