Size distribution and electroluminescence of self-assembled Ge dots

Citation
L. Vescan et al., Size distribution and electroluminescence of self-assembled Ge dots, J APPL PHYS, 87(10), 2000, pp. 7275-7282
Citations number
35
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
87
Issue
10
Year of publication
2000
Pages
7275 - 7282
Database
ISI
SICI code
0021-8979(20000515)87:10<7275:SDAEOS>2.0.ZU;2-O
Abstract
In this article we study the electroluminescence of p-i-n diode structures with Ge dots consisting of coherent three-dimensional small (pyramids) and larger (dome) islands. The Ge dots are formed through strain-induced island ing. The diode structures, including one layer with Ge dots, were deposited on Si mesas with variable areas in order to study the influence of limited area deposition on self-assembling. It was observed that the reduction of deposited area improves island uniformity. The combined analysis of island distribution and electroluminescence spectra has lead to the conclusion tha t domes in small diodes have a smaller Si content or are less relaxed than domes in larger diodes. The diodes are found to emit up to room temperature near the optical communication wavelength of 1.3 microns. (C) 2000 America n Institute of Physics. [S0021-8979(00)04610-7].