Processing of X-ray diffraction imaging data using remote sensing techniques

Citation
T. Wroblewski et al., Processing of X-ray diffraction imaging data using remote sensing techniques, J MAT SCI L, 19(11), 2000, pp. 975-978
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE LETTERS
ISSN journal
02618028 → ACNP
Volume
19
Issue
11
Year of publication
2000
Pages
975 - 978
Database
ISI
SICI code
0261-8028(200006)19:11<975:POXDID>2.0.ZU;2-1