Photoluminescent properties of cadmium selenide in contact with solutions and films of metalloporphyrins: Nitric oxide sensing and evidence for the aversion of an analyte to a buried semiconductor-film interface
A. Ivanisevic et al., Photoluminescent properties of cadmium selenide in contact with solutions and films of metalloporphyrins: Nitric oxide sensing and evidence for the aversion of an analyte to a buried semiconductor-film interface, J AM CHEM S, 122(15), 2000, pp. 3731-3738
The band-edge photoluminescence (PL) intensity of etched n-CdSe single crys
tals is quenched reversibly by adsorption of the trivalent metalloporphyrin
s, MTPPCl (TPP = tetraphenylporphyrin; M = Mn, Fe, Co) in nitrogen-saturate
d methylene chloride solution. The PL responses are concentration dependent
and can be fit to the Langmuir adsorption isotherm model to yield binding
constants of similar to 10(3)-10(4) M-1. The MTPPCl compounds react irrever
sibly with NO in solution to form nitrosyl adducts, and these compounds rev
ersibly enhance the CdSe PL intensity when adsorbed onto the semiconductor
surface, also with binding constants of similar to 10(3)-10(4) M-1. Films o
f MTPPCl were prepared on CdSe substrates by solvent evaporation. These coa
tings serve as transducers for NO detection: while the bare CdSe surface sh
ows no response to NO gas relative to N-2, the coated surfaces reversibly e
nhance the PL intensity (CoTPPCl) or quench it (MnTPPCl and FeTPPCl), with
binding constants on the order of similar to 1 atm(-1). In contrast to the
PL results, which are particularly sensitive to the semiconductor-film inte
rface, electronic and IR spectral changes of the bulk film induced by NO bi
nding were irreversible. The UV-vis and IR spectra could be spectroscopical
ly mimicked by preformed nitrosyl adduct films that were prepared by solven
t evaporation of MTPPCl (M = Co, Fe) and MTPP (M = Co) solutions that had b
een exposed to NO. These films, however, lack transduction capability, as t
he PL intensity is the same in NO and N-2 ambients. For the films prepared
from FeTPPCl and CoTPPCl, the saturation of IR and UV-vis spectral changes
occurs at NO pressures at least 10-fold lower than observed for PL changes.
These results indicate that NO has a strong aversion to binding at the sem
iconductor-film interface as opposed to the bulk film environment. Steric a
nd electronic contributions to these observed effects are discussed.