Jones-matrix analysis with Pauli matrices: application to ellipsometry

The coherency matrix formalism based on Pauli matrices is applied to analyz e a general ellipsometer that is described by Jones matrices. Here the Jone s matrices are represented as sums of appropriate coefficients times the Pa uli matrices and the identity matrix, and intensities are represented as tr aces of coherency matrices. This approach allows us not only to treat parti al polarizations explicitly but also to take advantage of various identitie s to reduce to algebra the operations necessary for system analysis. A gene ral expression is obtained for the intensity transmitted through a polarize r-sample-compensator-analyzer (PSCA) ellipsometer. This general expression is applied to an ideal PSCA ellipsometer, and then the results are reduced to describe several simpler but commonly used configurations. The results p rovide insight regarding general capabilities and limitations and allow us to compare different ellipsometer systems directly. Finally, this expressio n is extended to include artifacts, the explicit representation of which al lows a complete determination of their defects. (C) 2000 Optical Society of America [S0740-3232(00)01505-2].