In this work. the nanostructured rutile-phase titania with mean grain size
of 8.5 nm was synthesized by PEPVD (plasma-enhanced physical vapor depositi
on) method, the measurements on frequency spectra of capacities and dielect
ric loss for corresponding bulk and film specimens have been conducted by u
sing ac LRC method, and the conductivity and the polarization relaxation ti
me have also been calculated from the frequency spectra of real and imagina
ry parts of the dielectric constants. It has been found that there exist ab
normal dielectric behaviors in the bulk and film specimens. In low-frequenc
y range, the dielectric constants of nanostructured specimens increase dram
atically with decreasing frequency and are 10 similar to 10(2) times higher
than that of the corresponding coarse-grained counterpart. The aforementio
ned anomalous dielectric behaviors imply the existence of new polarization
mechanism caused by the defects and the dangling bonds within the numerous
interfaces. (C) 2000 Elsevier Science S.A. All rights reserved.